A review of NBTI mechanisms and models

descriptionPublicationkeyboard_double_arrow_right Article 01 Feb 2018 English Publisher:Elsevier BVJournal:Microelectronics Reliability, volume 81, pages 127-135 (issn: 0026-2714,

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Authors: Souvik Mahapatra; Narendra Parihar;

doi: 10.1016/j.microrel.2017.12.027

A review of NBTI mechanisms and models

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Abstract

Abstract A comprehensive review is done of different NBTI mechanisms and models proposed in the literature over the past years. The Reaction-Diffusion (RD) model based comprehensive framework and the alternative Energy Well (EW) models are discussed. The model capabilities to simultaneously predict the temporal kinetics of stress and recovery are evaluated. Key experimental signatures that support or refute model assumptions are highlighted.

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Indian Institute of Technology Bombay
India

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