Abstract This tutorial paper describes an approach how to improve root-cause finding of electronic component failures by means of a system-related failure anamnesis approach. While traditional failure analysis tries to analyze on device level, this system-related method starts by providing a failure anamnesis on system level, systematically continuing downwards via subsystems, wiring, and printed circuit boards (PCBs) towards the device level. In opposite to the subject (device)-related failure analysis, anamnesis evaluates possible root causes on their physical and statistical evidence, starting on a system level.