What is Electrical Overstress? - Analysis and Conclusions

descriptionPublicationkeyboard_double_arrow_right Article 01 May 2015 English Publisher:Elsevier BVJournal:Microelectronics Reliability, volume 55, pages 853-862 (issn: 0026-2714,

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Authors: K. T. Kaschani;

doi: 10.1016/j.microrel.2015.03.003

What is Electrical Overstress? - Analysis and Conclusions

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Abstract

Abstract In order to analyse the reasons for continuously high failure rates due to electrical overstress (EOS) a large number of publications published over the past 40 years in the field of EOS is investigated and evaluated. It is found that there is no common understanding on EOS. To resolve this problem criteria for a suitable EOS definition are introduced and a corresponding definition is proposed.

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Texas Instruments (United States)
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