This discussion is meant to look back at reliability progress over the last thirty years and identify trends and shortcomings. The main body of published work came from the ROCS workshop. While the workshop addresses various specific issues individually, it is the accumulation of a variety of data, information, and experience which forms the basis of an assessment of reliability. In the end, reliability is simply an insightful perception of facts and statistics. After 20-years of workshop meetings and three decades of accumulation of compound semiconductor reliability information, it is time to review, compare, and discuss the progress and the future of reliability for compound semiconductors.