A new probe for acquiring ESR images with microscopic resolution and high spin sensitivity, at a temperature range of ~4.2-300 K, is presented. Details of the probe design, as well as its principle of operation, are provided. The probe incorporates a unique surface loop-gap microresonator. Experimental results demonstrate the system's capability to acquire two - as well as three-dimensional images with a flat test sample of phosphorus-doped silicon. The imaging results also allow verifying the resonator's resonance mode - they show its B(1) distribution, which also makes it possible to estimate the number of spins measured in the sample.