Comparison of L-curve and LOOCV depth profiles from TAARXPS data

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 2017 English Publisher:Elsevier BVJournal:Journal of Electron Spectroscopy and Related Phenomena, volume 214, pages 1-7 (issn: 0368-2048,

Copyright policy )Funded by:NSERC | unidentified

Authors: R.W. Paynter;

doi: 10.1016/j.elspec.2016.11.003

Comparison of L-curve and LOOCV depth profiles from TAARXPS data

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Abstract

Abstract Time and angle resolved X-ray photoelectron spectroscopy (TAARXPS) data, obtained from polystyrene samples exposed to an oxygen/helium plasma, have been interpreted using 1st order Tikhonov regularization to smooth the extracted depth profiles. Two methods for the choice of the regularization parameter, namely the L-curve method and leave-one-out cross-validation (LOOCV), are compared and contrasted.

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Institut National de la Recherche Scientifique
Canada

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