Abstract An equation, which describes the dependence of critical micelle concentration (XCMC) with temperature, has been derived on the basis of Δ G 0 =−RT ln K , linear behavior of the enthalpy of micellization with temperature, and compensation phenomena in which the enthalpy and the entropy of micellization change linearly with each other. The new equation has yielded excellent fitting results of XCMC(T) for various surfactant systems. More interestingly, it yields d=2, irrespective of surfactant system, in the power-law description of XCMC(T), |X CMC −X CMC ∗ |= const |T−T ∗ | d with the minimum CMC, X CMC ∗ , and the temperature, T* at X CMC ∗ . The value of d=2 is confirmed from the fits to reported literature data.