
Abstract Mueller matrix (MM) measurements offer the ability to quantify the depolarization capability of a sample. Depolarization can be estimated using terms such as the depolarization index or the average degree of polarization. However, these calculations require measurement of the complete MM. We propose an alternate depolarization metric, termed the Jones matrix quality factor, QJM, which does not require the complete MM. This metric provides a measure of how close, in a least-squares sense, a Jones matrix can be found to the measured Mueller matrix. We demonstrate and compare the use of QJM to other traditional calculations of depolarization for both isotropic and anisotropic depolarizing samples; including non-uniform coatings, anisotropic crystal substrates, and beetle cuticles that exhibit both depolarization and circular diattenuation.
Depolarization; Spectroscopic ellipsometry; Mueller matrix; Mueller matrix ellipsometry; Jones matrix quality factor; Depolarization; Index; Thickness nonuniformity; Anisotropy, Manufacturing, Surface and Joining Technology, Bearbetnings-, yt- och fogningsteknik
Depolarization; Spectroscopic ellipsometry; Mueller matrix; Mueller matrix ellipsometry; Jones matrix quality factor; Depolarization; Index; Thickness nonuniformity; Anisotropy, Manufacturing, Surface and Joining Technology, Bearbetnings-, yt- och fogningsteknik
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