
Abstract In the present work, CZTS thin films have been prepared by sulfurization of electrodeposited Cu–Zn–Sn (CZT) precursor. Prior to sulfurization, as-deposited CZT precursors have been soft annealed in Ar atmosphere at different temperatures (250–350 °C). The structural, morphological, compositional and optical properties of the films have been investigated in detail. It is found that, soft annealing temperature has a significant impact on the properties of CZTS thin films. The systematic study on the improvement in the properties of CZTS films using soft annealing route has been studied and discussed.
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