The general approach to the detailed characterizing of peak properties based on the use of characteristic points on a peak contour located at the certain levels is proposed. Three basic functions of peaks have been chosen which are submitted in normalized form on height and width. The ability to characterize a peaks shape of a certain analytical series is shown by an example of series of analytical peaks of thallium obtained by stripping voltammetry at linear and step potential sweep. Also the proposed shape parameters are studied for groups of stripping voltammetry and chromatographic peaks.