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The scan nonlinearity of scanning electron microscopes is estimated with the use of a relief element with known geometric form of the profile. The mean value of the step of the test relief structure, which is determined as a test sample is moved along the scanning axis X, is measured. It is experimentally demonstrated that with a 5× magnification, the maximum relative deviation from the mean value of the step of the test structure for a given microscope does not exceed 0.4%.
citations This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |