Study of modal structure of a semiconductor laser by measurement of the complex degree of coherence

descriptionPublicationkeyboard_double_arrow_right Article 01 Jul 1980 English Publisher:Springer Science and Business Media LLCJournal:Annales des Télécommunications, volume 35, pages 231-235 (issn: 0003-4347, eissn: 1958-9395,

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Authors: Paolo Spano; Jean-Marc Dumant; Yvan Guillausseau;

doi: 10.1007/bf02998385

Study of modal structure of a semiconductor laser by measurement of the complex degree of coherence

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Abstract

The evaluation of the amplitude of the lateral transverse modes emitted by a semiconductor laser, by means of near or farfield techniques, generally is not easy. In this paper the behaviour of the optical coherence function provides much more sensitive method of analysis. A simple way of implementing the above analysis is described and the results of an experiment are reported.

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