Invariants in metrology and technical diagnostics

descriptionPublicationkeyboard_double_arrow_right Article 01 Jun 1996 English Publisher:Springer Science and Business Media LLCJournal:Measurement Techniques, volume 39, pages 577-593 (issn: 0543-1972, eissn: 1573-8906,

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Authors: L. A. Mironovskii; V. A. Slaev;

doi: 10.1007/bf02369819

Invariants in metrology and technical diagnostics

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Abstract

The interrelationship between metrology and technical diagnostics is analyzed. Parallels are noted in the ideas, concepts, and metrological and diagnostic procedures, including aims, objects, models, parameters, methods, apparatus, processing, and estimation of results. It is found to be promising to utilize the theory of invariants in metrology and technical diagnostics. Different types of invariant are given for linear dynamic systems.

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