XRF induced by PIXE (XRF-PIXE) using silver as a primary target was compared with a standard radioisotope XRF system using Cd-109 as a primary exciting source, for the analysis of single-element thin standards. The sensitivity of the two methods were determined for elements from Cl to Mo. XRF is found to be more sensitive for elements from Cl to Mn, whereas XRF-PIXE is found to be more suitable for elements from Fe to Mo. Both techniques can be considered as complementary to each other.