The fabrication of an integrated wavefront sensor implemented in standard microelectronics CMOS technology is presented. It is aimed at sensing the aberrations (distortions) present in a light beam. The device benefits from electronic functions integrability, straightforward concept and adequate speed for most Adaptive Optics applications. It consists of an array of 8x8 addressable quad-cells with an analog demultiplexor and sampling-rate controller and a custom Hartmann mask to sample the incident light.