
This paper describes a method supporting recognition of unnatural patterns on a Shewhart X chart by analysis of its frequency distribution. It has been implemented as a program that simulates data from a statistically controlled process as well as from a process affected by patterns. The following patterns are simulated: sudden shift, trend, stratification, systematic variable, cycle and mixture
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| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
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