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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IRIS Cnrarrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
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Part of book or chapter of book . 2012
Data sources: IRIS Cnr
https://doi.org/10.1007/978-3-...
Part of book or chapter of book . 2012 . Peer-reviewed
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Nanoscale Fabrication

Authors: Tseng Ampere A; Du Zuliang; Notargiacomo Andrea; Jou Shyankay;

Nanoscale Fabrication

Abstract

Miniaturization is the central theme in modern fabrication technology. Following the introduction of nanofabrication and its significance the two major nanolithographic processes using electron and ion beams are first addressed. These processes are similar to the conventional photolithography by using energetic beams for pattern transfer to the target substrate. Subsequently, the lithographic techniques of nanoimprinting and scanning probe microscopy (SPM) are evaluated with the emphasis on their lithographic abilities and applications. Three major schemes in the family of SPM lithography, including (1) scanning tunneling microscopy, (2) atomic force microscopy, and (3) dippen nanolithography, are separately presented. The principles and associated procedures of these three schemes are discussed first and the differences among them are then elaborated. The bottom-up strategies for nanofabrication are also reviewed. Self assembling with and without externally controlled forces for patterning nanoscale structures has been examined. The associated principles and procedures of key assembling processes are given. Application examples for several self-assembly techniques are also included. Finally, the prospective areas for future research in nanofabrication are presented.

Keywords

focused-ion beam lithography, electron beam lithography, nanoimprinting, nanofabrication, nanolithography, Atomic

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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