descriptionPublicationkeyboard_double_arrow_right Part of book or chapter of book , Other literature type 01 Jan 2015 English Publisher:Springer International Publishing

Authors: Bert Voigtländer;

doi: 10.1007/978-3-030-13654-3_12 , 10.1007/978-3-662-45240-0_13

Static Atomic Force Microscopy

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Abstract

In static atomic force microscopy the force between the tip and sample leads to a deflection of the cantilever according to Hooke’s law.

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Forschungszentrum Jülich
Germany

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