Among the performance indices for successful IC manufacturing, the yield of manufacturing is regarded as the most important one. Yield is usually defined as the ratio of the number of usable items after the completion of production processes to the number of potentially usable items at the beginning of production [148]. In order to reduce the cycle time and cost, rapid identification of yield losses and early elimination of them are critical. El-Kareh et al. [122] emphasize that the process of reducing the chip size should be accompanied by the improvement of yield in order to obtain productivity. They define the chip cost as $$Chip \cos t=\frac{\cos t per wafer}{yied x number of dice per wafer}.$$