ZIMMERMANN: Let me begin the panel discussion on Data Analysis Trends in X-ray and Gamma-ray astronomy by first introducing the panel members. These are from the left to the right: Roland Diehl, Ethan Schreier, Rosolino Buccheri, Livio Scarsi, Jean-Marc Chassery and Wolfgang Voges. With the exception of Jean-Marc Chassery, who is an expert on image processing and statistical analysis, all the others have longer experience in the X-ray and Gamma-ray fields. May I ask the speakers to keep their contributions to not more than five minutes, in order to allow ample room for discussion with the audience.