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The Transmission Electron Microscope

Name: The Transmission Electron Microscope
Creator: Earl J. Kirkland

descriptionPublicationkeyboard_double_arrow_right Part of book or chapter of book , Other literature type 01 Jan 1998Publisher:Springer US

Authors: Earl J. Kirkland;

doi: 10.1007/978-1-4419-6533-2_2 , 10.1007/978-1-4757-4406-4_2 , 10.1007/978-3-030-33260-0_2

The Transmission Electron Microscope

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Abstract

This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanning modes). It starts with the fundamental physics of electron dynamics for energies in the range 100–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are discussed. Various approximation used in modeling the microscope are introduced. Optical aberrations are defined, and general methods of aberration correction are described briefly.

Related Organizations

Cornell University
United States

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