Examination of contamination on electrical insulators by XPS

descriptionPublicationkeyboard_double_arrow_right Article 01 Apr 1979 English Publisher:WileyJournal:Surface and Interface Analysis, volume 1, pages 71-72 (issn: 0142-2421, eissn: 1096-9918,

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Authors: I. W. Drummond;

doi: 10.1002/sia.740010206

Examination of contamination on electrical insulators by XPS

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Abstract

Abstract A method is described which allows samples to be taken form the surface of electrical insulators which suffer electrical breakdown. The insulator does not have to be removed form its immediate environment. The contaminant is removed by ‘stripping’ it off with adhesive tape and the tape is subsequently examined by XPS.

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