AbstractA scanning electron microscope (SEM) system equipped with a motor drive specimen stage fully controlled with a personal computer (PC) has been utilized for obtaining ultralow magnification SEM images. This modern motor drive stage works as a mechanical scanning device. To produce ultra‐low magnification SEM images, we use a successful combination of the mechanical scanning, electronic scanning, and digital image processing techniques. This new method is extremely labor and time saving for ultra‐low magnification and wide‐area observation. The option of ultra‐low magnification observation (while maintaining the original SEM functions and performance) is important during a scanning electron microscopy session.