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Article . 1995 . Peer-reviewed
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Frictional effects in atomic force microscopy of Langmuir‐Blodgett films

descriptionPublicationkeyboard_double_arrow_right Article 01 May 1995 English Publisher:WileyJournal:Scanning, volume 17, pages 192-195 (issn: 0161-0457, eissn: 1932-8745, Copyright policy )
Authors: J. C. van Milterburg; J.P. van der Eerden; E. ten Grotenhuis;

doi: 10.1002/sca.4950170311

Frictional effects in atomic force microscopy of Langmuir‐Blodgett films

Abstract

AbstractFrictional effects in atomic force microscopy (AFM) of Langmuir‐Blodgett films of 1, 2‐dipalmitoyl‐snglycero‐phosphoglycerol were examined. Height measurements of the Langmuir layers are strongly influenced by the orientation of the cantilevers used in AFM relative to the sample. A simple model is used to describe the frictional effects and to calculate the real height of the monolayers.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
1
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