Sources of contamination in electron optical equipment

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 1981 English Publisher:WileyJournal:Scanning, volume 4, pages 32-39 (issn: 0161-0457, eissn: 1932-8745,

Copyright policy )

Authors: G. Love; V. D. Scott; N. M. T. Dennis; L. Laurenson;

doi: 10.1002/sca.4950040105

Sources of contamination in electron optical equipment

- Summary
- Metrics

Abstract

AbstractContamination in electron optical equipment may occur in the form of carbonaceous deposit on the specimen undergoing analysis or condensation and/or polymerisation of extraneous matter upon other components of the instrument. Almost without exception these effects are undesirable and in this paper we review sources of contamination and discuss methods of minimising the problem.

Related Organizations

University of Bath
United Kingdom

Impact byBIP!

	selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	39
	popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.	Top 10%
	influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).	Top 10%
	impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.	Top 10%