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Laser Physics Letters
Article . 2006 . Peer-reviewed
License: IOP Copyright Policies
Data sources: Crossref
https://dx.doi.org/10.48550/ar...
Article . 2006
License: arXiv Non-Exclusive Distribution
Data sources: Datacite
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A scanning electron microscope for ultracold atoms

Authors: Herwig Ott; C. Utfeld; N Hommerstad; Tatjana Gericke;

A scanning electron microscope for ultracold atoms

Abstract

We propose a new technique for the detection of single atoms in ultracold quantum gases. The technique is based on scanning electron microscopy and employs the electron impact ionization of trapped atoms with a focused electron probe. Subsequent detection of the resulting ions allows for the reconstruction of the atom's position. This technique is expected to achieve a much better spatial resolution compared to any optical detection method. In combination with the sensitivity to single atoms, it makes new in situ measurements of atomic correlations possible. The detection principle is also well suited for the addressing of individual sites in optical lattices.

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Keywords

Statistical Mechanics (cond-mat.stat-mech), FOS: Physical sciences, Condensed Matter - Statistical Mechanics

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citations
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
16
Average
Top 10%
Top 10%
Green
bronze
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