
doi: 10.1002/etep.192
AbstractIn this paper, a simulating method of forecasting durability of main contact assembly of electromagnetic connectors is presented on the basis of laboratory‐curtailed inspection. New multi‐parameter simulating model to forecasting the durability of contacts of electromagnetic connectors is presented. MATHCAD application was utilized during inspections. Copyright © 2007 John Wiley & Sons, Ltd.
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