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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao International Journa...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
International Journal of Circuit Theory and Applications
Article . 2023 . Peer-reviewed
License: Wiley Online Library User Agreement
Data sources: Crossref
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Error‐correcting cryptographic S‐boxes with multiple error detection and correction

Authors: Bahram Rashidi;

Error‐correcting cryptographic S‐boxes with multiple error detection and correction

Abstract

SummaryIn this paper, the error‐correcting 4‐bit S‐boxes for cryptography applications with multiple error detection and correction are presented. Three 4‐bit S‐boxes which are used in the lightweight block ciphers PRESENT, Midori, and KLEIN are considered for implementation of the error‐correcting method. The proposed method does not require two redundant S‐boxes for repairing the S‐box. The main circuit of the S‐box is implemented concurrently with the low‐cost error‐correcting part of the structure. This reduces the overall area consumption and delay of the proposed error‐correcting method (the area consists of the 4‐bit S‐box and self‐checking/error‐correcting circuits). In the proposed error‐correcting method, the outputs of the S‐box are tested individually and it can detect and repair transient and permanent faults simultaneously. Therefore, the structure can detect and repair the single, double, triple, and quadruple faults at a time. The area and timing results, in 180 nm CMOS technology, show the proposed structures are acceptable in terms of area and delay overheads than those of the other methods.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
2
Average
Average
Average
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