Thermally Triggered Degradation of Transient Electronic Devices

descriptionPublicationkeyboard_double_arrow_right Article 20 May 2015 English Publisher:WileyJournal:Advanced Materials, volume 27, pages 3,783-3,788 (issn: 0935-9648, eissn: 1521-4095,

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Authors: Chan Woo, Park; Seung-Kyun, Kang; Hector Lopez, Hernandez; Joshua A, Kaitz; Dae Seung, Wie; Jiho, Shin; Olivia P, Lee; +4 Authors

doi: 10.1002/adma.201501180

pmid: 25991389

Thermally Triggered Degradation of Transient Electronic Devices

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Abstract

Thermally triggered transient electronics using wax-encapsulated acid, which enable rapid device destruction via acidic degradation of the metal electronic components are reported. Using a cyclic poly(phthalaldehyde) (cPPA) substrate affords a more rapid destruction of the device due to acidic depolymerization of cPPA.

Related Organizations

University of Illinois at Urbana Champaign
United States
University of Illinois System
United States
Korea Atomic Energy Research Institute
Korea (Republic of)

Keywords

Electrical Equipment and Supplies, Temperature, Polymerization, Metals, Waxes, Freezing, Materials Testing, Magnesium, Glass, Acids, o-Phthalaldehyde

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