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Article . 2023
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Electrical Noise and Semiconductor Reliability

descriptionPublicationkeyboard_double_arrow_right Article 01 Dec 2023 English
Authors: Băjenescu, T.I.;

Electrical Noise and Semiconductor Reliability

Abstract

Low-frequency electrical noise is a sensitive measure of defects in semiconductor devices because the noise has an impact, directly or indirectly, on the performance and reliability of the device. Its measurement is particularly important to characterize noise in semiconductor devices.

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Keywords

noise, bias, experimental, Magnetic, Single crystal, system technical, transit time, magnetic field, recombination, holes, side arms, filament, Semiconductors, electrical noise, surface, lifepath, noise voltage

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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