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Выявление путей образования примесей в пропиточных растворах Mn(No 3) 2 при производстве оксидно-полупроводниковых конденсаторов

Выявление путей образования примесей в пропиточных растворах Mn(No 3) 2 при производстве оксидно-полупроводниковых конденсаторов

Abstract

На сегодняшний день основным способом получения катодного покрытия диоксида марганца на пористом танталовом аноде в производстве конденсаторов является пропитка анодов в растворах азотнокислого марганца различных концентраций с последующим пиролитическим разложением соли. Однородность получаемого покрытия и электрические параметры конденсаторов во многом зависят от качества пропиточных растворов нитрата марганца, которое определяется отсутствием в них твердых примесных частиц с диаметром более 1 мкм, а также примесей, негативно влияющих на электрические характеристики конденсаторов. Анализ состава пропиточных растворов, эксплуатируемых в течение девяти месяцев, показал, что в растворах происходит накопление таких примесей, как оксиды, оксигидроксид и нитриды марганца. Состав и свойства примесей значительно разнятся, а следовательно, различно и влияние их на качество и электрические характеристики готовых конденсаторов. В связи с этим возникает необходимость выявления механизма образования нежелательных примесей в растворах азотнокислого марганца. В последующем это позволит разработать мероприятия по предотвращению их образования и очистке пропиточных растворов от примесей. Представлены результаты теоретического анализа и экспериментальных исследований возможных причин и путей образования примесей в растворах нитрата марганца при производстве танталовых оксидно-полупроводниковых конденсаторов.

To date, the general way of production of cathode coating of MnO 2 on porous tantalum anode in the manufacture of capacitors is carried out by multiple stages of impregnation and pyrolysis of manganese nitrate. Homogeneity of coating and electrical properties of capacitors are heavily influenced by quality of impregnating solutions. Quality of impregnating solutions is determined by the absence in them solid particles with diameter more than 1 mkm, and impurities with bad electrical properties. Composition analysis of old impregnating solutions reveals the presence of such impurities, as manganese oxides, nitrides and oxohydroxide. Thereby, composition and properties of the impurities are very different, and, that’s way, they have different influence on electrical properties of capacitors. Therefore, it is necessary to determine the formation mechanism of impurities in solutions of manganese nitrate. This will allow to propose measures of cleaning of impregnating solutios. Рresented results of theoretical analysis and practical research of possible ways of formation of impurities in manganese nitrate solutions in the manufacture of oxide-semiconductor capacitors.

Keywords

НИТРАТ МАРГАНЦА,MANGANESE NITRATE,ОКСИДЫ МАРГАНЦА,MANGANESE OXIDES,КАТОДНОЕ ПОКРЫТИЕ,CATHODE COATING,ПРОПИТОЧНЫЕ РАСТВОРЫ,IMPREGNATING SOLUTIONS,НИТРИДЫ МАРГАНЦА,MANGANESE NITRIDES,ОКСОГИДРОКСИД МАРГАНЦА,MANGANESE OXOHYDROXIDE,ТЕРМОДИНАМИЧЕСКИЙ АНАЛИЗ,THERMODYNAMIC ANALYSIS

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
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