Диагностика интегральных схем по частотным характеристикам при различных напряжениях питания и температурах
Copyright policy )Диагностика интегральных схем по частотным характеристикам при различных напряжениях питания и температурах
In the article is described technique of detecting devices containing defects in the structure. Basing on this we conclude the reliability of devices. This technique is a modified method of critical voltage, complete research instruments at varying temperature and frequency. We investigated the devices fabricated in CMOS technology and functionally M561TM2 represent D-flip-flop. The study revealed different behavior fronts rise of IC in the CV at 1 MHz and two temperatures 20°C and 100°C
Рассмотрены методы оценки потенциальной надежности интегральных схем (ИС) по их частотным характеристикам, измеренным в широком диапазоне напряжений питания при различных температурах
КРИТИЧЕСКОЕ НАПРЯЖЕНИЕ ПИТАНИЯ, ПОВЫШЕННАЯ ТЕМПЕРАТУРА, ВРЕМЯ НАРАСТАНИЯ, ЧАСТОТНЫЕ ХАРАКТЕРИСТИКИ
КРИТИЧЕСКОЕ НАПРЯЖЕНИЕ ПИТАНИЯ, ПОВЫШЕННАЯ ТЕМПЕРАТУРА, ВРЕМЯ НАРАСТАНИЯ, ЧАСТОТНЫЕ ХАРАКТЕРИСТИКИ
selected citations These citations are derived from selected sources.This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).0 popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.Average influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).Average impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.Average
Citations provided by BIP!Popularity provided by BIP!