
It has been proposed to determine the contrast in electron microscopy image via the total electron fluxes scattered beyond the aperture diaphragm by local areas of the object under study to analyze quantitatively the amplitude (absorption) contrast of the amorphous objects with different types of heterogeneities of the atomic and continual structure. The significant properties of the determined contrast are its linear dependence on the difference of electron beam fluxes that form the image and a convenient range of variation from 0 to 1 relative units.
Мікроструктура, Аморфные материалы, Електронна мікроскопія, Дифракція електронів, Physics, QC1-999, Амплитудный контраст, Электронная микроскопия, Микроструктура, Амплітудний контраст, Amorphous material, Electron diffraction, Electron microscopy, Microstructur, Amplitude contrast, Microstructure, Аморфні матеріали, Дифракция электронов
Мікроструктура, Аморфные материалы, Електронна мікроскопія, Дифракція електронів, Physics, QC1-999, Амплитудный контраст, Электронная микроскопия, Микроструктура, Амплітудний контраст, Amorphous material, Electron diffraction, Electron microscopy, Microstructur, Amplitude contrast, Microstructure, Аморфні матеріали, Дифракция электронов
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