
We introduced the spectrum-adapted expectation-conditional maximization (ECM) algorithm to improve the efficiency of the peak fitting of spectral data by various fitting models. The spectrum-adapted ECM algorithm can perform the peak fitting by using the Pseudo–Voigt mixture model and Doniach–Šunjić–Gauss mixture model which are generally used for the peak fitting in the X-ray photoelectron spectroscopy. Analyses of the synthetic and experimental spectral data showed that the proposed method quickly completed the calculation and estimated well-fitted curves to spectral data. This result suggests that the spectrum adapted ECM algorithm efficiently perform the peak fitting for large number of spectral data sets.
high-throughput analysis, TA401-492, x-ray photoelectron spectroscopy, 530, peak fitting, Materials of engineering and construction. Mechanics of materials, expectation-conditional maximization algorithm
high-throughput analysis, TA401-492, x-ray photoelectron spectroscopy, 530, peak fitting, Materials of engineering and construction. Mechanics of materials, expectation-conditional maximization algorithm
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