
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 33 (2)
ISSN:1063-8210
ISSN:1557-9999
Area and energy efficiency; Guessing random additive noise decoding (GRAND); Ordered reliability bits GRAND (ORBGRAND); High throughput; VLSI implementation, Ordered reliability bits GRAND (ORBGRAND), High throughput, VLSI implementation, Guessing random additive noise decoding (GRAND), Area and energy efficiency
Area and energy efficiency; Guessing random additive noise decoding (GRAND); Ordered reliability bits GRAND (ORBGRAND); High throughput; VLSI implementation, Ordered reliability bits GRAND (ORBGRAND), High throughput, VLSI implementation, Guessing random additive noise decoding (GRAND), Area and energy efficiency
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