Composition dependence of structural and optical properties of Cd1−Zn Te thick films obtained by the close-spaced sublimation
Copyright policy )Composition dependence of structural and optical properties of Cd1−Zn Te thick films obtained by the close-spaced sublimation
Abstract This paper reports the results of structural, photoluminescence and Raman characterization of thick Cd 1− x Zn x Te films with different zinc concentration obtained by the close spaced vacuum sublimation method. The analysis of the X-rays patterns allows us to determine the effect of the zinc concentration on crystal quality of the films. It was found that samples with x ≈ 0.10 and x ≈ 0.32 have high crystal quality. However, with increasing of zinc concentration the crystal quality decreases. This result was confirmed by the photoluminescence study. Namely, the significant degradation of optical properties for the samples with high zinc concentration ( x > 0.32) was observed. Raman spectroscopy reveals the relation between zinc concentration and vibrational properties of the films. Also, the micro-Raman method shows that obtained films are uniform and free of tellurium inclusions.
- Sumy State University Ukraine
- Center for Physical Sciences and Technology Lithuania
- National Academy of Sciences of Ukraine Ukraine
- Institute for Condensed Matter Physics Ukraine
- Riga Technical University Latvia
crystal structure, Потрійні напівпровідникові сполуки, Lattice defects, Дефекты кристаллической решетки, Тройные полупроводниковые структуры, 530, Semiconducting ternary compounds, Рамановская спектроскопия, lattice defects, рентгенівська дифракція, дефекти гратки, потрійні напівпровідникові сполуки, Crystal structure, рентгеновская дифракция, Раманівська спектроскопія, Кристаллическая структура, Дефекти кристалічної гратки, фотолюминесценция, semiconducting ternary compounds, X-ray diffraction, фотолюмінесценція, Raman spectroscopy, photoluminescence, кристалічна структура, тройные полупроводниковые соединения, дефекты решетки, кристаллическая структура, Кристалічна структура
crystal structure, Потрійні напівпровідникові сполуки, Lattice defects, Дефекты кристаллической решетки, Тройные полупроводниковые структуры, 530, Semiconducting ternary compounds, Рамановская спектроскопия, lattice defects, рентгенівська дифракція, дефекти гратки, потрійні напівпровідникові сполуки, Crystal structure, рентгеновская дифракция, Раманівська спектроскопія, Кристаллическая структура, Дефекти кристалічної гратки, фотолюминесценция, semiconducting ternary compounds, X-ray diffraction, фотолюмінесценція, Raman spectroscopy, photoluminescence, кристалічна структура, тройные полупроводниковые соединения, дефекты решетки, кристаллическая структура, Кристалічна структура
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