Abstract Using both high dynamic range (HDR) and normalization methodologies, we show a method to improve the fringe pattern contrast in interferometric measurements normally used for phase recovering. In a simulated interferogram that mimics the main effects that can be found in an interferometric process (stray-light, photon noise, electronic noise, scattering phenomena, etc.) it was possible to improve the contrast of the fringes and to decrease the root mean square error by more than 35%. The method proposed is applied to experimental interferograms to measure wavefront error and retardance changes on liquid crystal (LC) devices. It is done by using a Mach–Zehnder set-up in which we used different polarization areas. The proposed method increases the quality of the phase recovered and decreases the root mean square error by 50%.