[Description of data collection methods] In-situ Grazing Incidence X-ray Diffraction (GIXRD) was performed at the BM25-SpLine beamline at the ESRF. Measurements were carried out during annealing under O₂, CO₂, H₂O and UHV, with temperature ranging from RT to 1100°C and pressures from 10⁻⁹ mbar to 1 bar. Films were epitaxially grown on SrTiO₃(001) substrates.

In-situ Grazing Incidence X-ray Diffraction (GIXRD) was performed at the BM25-SpLine beamline at the ESRF. Measurements were carried out during annealing under O₂, CO₂, H₂O and UHV, with temperature ranging from RT to 1100°C and pressures from 10⁻⁹ mbar to 1 bar. Films were epitaxially grown on SrTiO₃(001) substrates.

- CO2_10-4mbar.csv - CO2_10-6mbar.csv - CO2_10-8mbar.csv - CO2_mbar.csv - CO2_bar.csv - H2O_10-4mbar.csv - H2O_10-6mbar.csv - H2O_10-8mbar.csv - H2O_mbar.csv - O2_10-4mbar.csv - O2_10-6mbar.csv - O2_10-8mbar.csv - O2_1mbar.csv - UHV.csv

[Data processing methods] Data was integrated and extracted using beamline software and available processing tools at BM25-SpLine.

Spanish Ministerio de Ciencia, Innovación y Universidades and CSIC under Grant Nos. 2010 6O E 013 and 2021 60 E 030

Peer reviewed