
handle: 10261/381134
Additional x-ray reflectivity experiments performed on NSTO/LSMCO-SCO thin films with (001) and (110) out-of-plane orientation; electrical characterization of a pure LSMCO sample on NSTO, with top Pt electrode; calculated cumulative probabilities of the cycleto-cycle variability experiments shown in Figure 4; retention times corresponding to the same NSTO/LSMCO-SCO/Pt samples; optical top-view images of NSTO/LSMCO-SCO/Pt devices; STEM-EDX data corresponding to a stressed NSTO/LSMCO-SCO/Pt (110) device; impedance spectroscopy and memcapacitive effect recorded on a NSTO/LSMCO-SCO/Pt (001) device; tables showing the values of the fitted parameters of impedance spectroscopy spectra of NSTO/LSMCO-SCO/Pt samples with (001) and (110) orientations.
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