
The dataset captures the surface chemical characterization of NEPs. XPS is used to analyze surface composition, detecting elemental presence and chemical states. The element name, binding energy, R.S.F, FWHM of XPS peaks are recorded providing insights into chemical uniformity and % atomic concentration of the distribution of elements on the sample surface.
ERM00000560
ERM00000560
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 0 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
