Powered by OpenAIRE graph
Found an issue? Give us feedback
image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/ ZENODOarrow_drop_down
image/svg+xml art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos Open Access logo, converted into svg, designed by PLoS. This version with transparent background. http://commons.wikimedia.org/wiki/File:Open_Access_logo_PLoS_white.svg art designer at PLoS, modified by Wikipedia users Nina, Beao, JakobVoss, and AnonMoos http://www.plos.org/
ZENODO
Software . 2024
License: CC BY
Data sources: ZENODO
ZENODO
Software . 2024
License: CC BY
Data sources: Datacite
versions View all 2 versions
addClaim

This Research product is the result of merged Research products in OpenAIRE.

You have already added 0 works in your ORCID record related to the merged Research product.

Improving Patch Correctness Analysis via Random Testing and Large Language Models (Replication Package)

Authors: Molina, Facundo; Copia, Juan Manuel; Gorla, Alessandra;

Improving Patch Correctness Analysis via Random Testing and Large Language Models (Replication Package)

Abstract

Replication package for the paper: Improving Patch Correctness Analysis via Random Testing and Large Language Models. Facundo Molina, Juan Manuel Copia, and Alessandra Gorla. Accepted for publication in the Proceedings of the 17th IEEE International Conference on Software Testing, Verification and Validation (ICST 2024).

Related Organizations
Keywords

Large Language Models, Software Testing, Patch Correctness Assessment

Powered by OpenAIRE graph
Found an issue? Give us feedback