VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 01 Aug 2020Publisher:IEEEJournal:2020 Conference on Precision Electromagnetic Measurements (CPEM)

Authors: Kazemipour, Alireza; Hoffmann, Johannes; Wollensack, Michael; Allal, Djamel; Hudlicka, Martin; Ruefenacht, Juerg; Stalder, Daniel; +1 Authors

doi: 10.1109/cpem49742.2020.9191818 , 10.5281/zenodo.4243043 , 10.5281/zenodo.4243044

VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

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Abstract

A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on normalization to a "Thru" connection and analyzing error-terms and multiple-reflection phenomena. Measurement results (in free-space) are presented in 75-110 GHz and 500-750 GHz bands. Normalization technique can reduce the overall measurement uncertainties and simplify the material characterization process.

This work was supported by the European Metrology Programme for Innovation and Research (EMPIR), under 18SIB09-TEMMT project. EMPIR programme is co-financed by the Participating States and from the European Union's Horizon 2020 Research and Innovation Programme.

Related Organizations

Český Metrologický Institut
Czech Republic
Laboratoire National De Metrologie Et D'Essais
France
Swiss Federal Institute of Metrology
Switzerland

Keywords

parameter extraction, measurement uncertainty, material characterization, VNA time-gating, RF metrology

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