publication . Article . 2013

Bulk optical absorption of high resistivity silicon at 1550 nm

Jerome Degallaix; Raffaele Flaminio; Danièle Forest; Massimo Granata; Christophe Michel; Laurent Pinard; Teddy Bertrand; Gianpietro Cagnoli;
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  • Published: 04 Jun 2013 Journal: Optics Letters, volume 38, page 2,047 (issn: 0146-9592, eissn: 1539-4794, Copyright policy)
  • Publisher: The Optical Society
Abstract
We report on the measurement of the optical absorption of bulk crystalline silicon at 1550 nm. Using the photodeflection technique, absorption as low as 5  ppm/cm has been measured on a sample with a resistivity of 10 kΩ·cm . The absorption as a function of the resistivity has been derived for n-type silicon.
Subjects
Medical Subject Headings: sense organseye diseasestechnology, industry, and agriculture
free text keywords: Atomic and Molecular Physics, and Optics, Optoelectronics, business.industry, business, Optics, Electrical resistivity and conductivity, Crystalline silicon, Silicon, chemistry.chemical_element, chemistry, Extended X-ray absorption fine structure, Physics, High resistivity, Absorption (pharmacology), Laser beams, Refractive index
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