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Publication . Conference object . 2016

Characterizing the cross dispersion reflection gratings of CRIRES+

Roman Follert; D. R. Taubert; Jörg Hollandt; Christian Monte; Ernesto Oliva; Ulf Seemann; Tom Löwinger; +27 Authors
Open Access
Published: 01 Aug 2016 Journal: SPIE Proceedings (issn: 0277-786X, Copyright policy )
Publisher: SPIE
Country: Italy
The CRIRES+ project attempts to upgrade the CRIRES instrument into a cross dispersed Echelle spectrograph with a simultaneous recording of 8-10 diffraction orders. In order to transform the CRIRES spectrograph into a cross-dispersing instrument, a set of six reflection gratings, each one optimized for one of the wavelength bands CRIRES+ will operate in (YJHKLM), will be used as cross dispersion elements in CRIRES+. Due to the upgrade nature of the project, the choice of gratings depends on the fixed geometry of the instrument. Thus, custom made gratings would be required to achieve the ambitious design goals. Custom made gratings have the disadvantage, though, that they come at an extraordinary price and with lead times of more than 12 months. To mitigate this, a set of off-the-shelf gratings was obtained which had grating parameters very close to the ones being identified as optimal. To ensure that the rigorous specifications for CRIRES+ will be fulfilled, the CRIRES+ team started a collaboration with the Physikalisch-Technische Bundesanstalt Berlin (PTB) to characterize gratings underconditions similar to the operating conditions in CRIRES+ (angle of incidence, wavelength range). The respective test setup was designed in collaboration between PTB and the CRIRES+ consortium. The PTB provided optical radiation sources and calibrated detectors for each wavelength range. With this setup, it is possible to measure the absolute efficiency of the gratings both wavelength dependent and polarization state dependent in a wavelength range from 0.9 μm to 6 μm.
Subjects by Vocabulary

Microsoft Academic Graph classification: Physics Wavelength Optics business.industry business Detector Optical radiation Polarization (waves) Upgrade Grating Diffraction Spectrograph