publication . Article . Other literature type . 1992

Quantized adhesion detected with the atomic force microscope

Jan H. Hoh; J. P. Cleveland; Craig Prater; Jean Paul Revel; Paul K. Hansma;
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  • Published: 01 Jun 1992 Journal: Journal of the American Chemical Society, volume 114, pages 4,917-4,918 (issn: 0002-7863, Copyright policy)
  • Publisher: American Chemical Society (ACS)
Abstract
The atomic force microscope (AFM) is rapidly becoming a powerful tool for investigating surface chemistry and adhesion. Current efforts with this new instrument are guided by the pioneering research of Israelachvili and his colleagues, whose work with the surface force apparatus has laid the foundation for investigating interactions near and between surfaces. The AFM is capable of measuring forces of less than 10^(-11) N with high spatial resolution, thus making possible the study of very weak interactions and local surface chemistry. Here we report the first (to our knowledge) observation of discrete adhesive interactions with measured forces of 1 x 10^(-11) N....
Subjects
free text keywords: Colloid and Surface Chemistry, Biochemistry, General Chemistry, Catalysis, Conductive atomic force microscopy, Chemistry, Adhesive, Surface forces apparatus, Nanotechnology, Maxima and minima, Chemical physics, Adhesion, Magnetic force microscope, Inorganic compound, chemistry.chemical_classification, Quantization (physics)
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