publication . Other literature type . Article . 2001

Fabrication and Characterization of Metal−Molecule−Metal Junctions by Conducting Probe Atomic Force Microscopy

David J. Wold; C. Daniel Frisbie;
  • Published: 01 Jun 2001
  • Publisher: American Chemical Society (ACS)
Abstract
Metal−molecule−metal junctions were fabricated by contacting Au-supported alkyl or benzyl thiol self-assembled monolayers (SAMs) with an Au-coated atomic force microscope (AFM) tip. The tip−SAM microcontact is approximately 15 nm2, meaning the junction contains ∼75 molecules. Current−voltage (I−V) characteristics of these junctions were probed as a function of SAM thickness and load applied to the microcontact. The measurements showed:  (1) the I−V traces were linear over ±0.3 V, (2) the junction resistance increased exponentially with alkyl chain length, (3) the junction resistance decreased with increasing load and showed two distinct power law scaling regimes...
Subjects
free text keywords: Colloid and Surface Chemistry, Biochemistry, General Chemistry, Catalysis, Alkane, chemistry.chemical_classification, chemistry, Bilayer, Molecule, Alkyl, Thiol, Analytical chemistry, Fabrication, Monolayer, Metal, visual_art.visual_art_medium, visual_art
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