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Probing microwave fields and enabling in-situ experiments in a transmission electron microscope.
Goncalves, F.J.T.; Paterson, G.W.; McGrouther, D.; Drysdale, T.; Togawa, Y.; Schmool, D.S.; Stamps, R.L.;
Goncalves, F.J.T.; Paterson, G.W.; McGrouther, D.; Drysdale, T.; Togawa, Y.; Schmool, D.S.; Stamps, R.L.;
Probing microwave fields and enabling in-situ experiments in a transmission electron microscope.
Abstract A technique is presented whereby the performance of a microwave device is evaluated by mapping local field distributions using Lorentz transmission electron microscopy (L-TEM). We demonstrate the method by measuring the polarisation state of the electromagnetic fields produced by a microstrip waveguide as a function of its gigahertz operating frequency. The forward and backward propagating electromagnetic fields produced by the waveguide, in a specimen-free experiment, exert Lorentz forces on the propagating electron beam. Importantly, in addition to the mapping of dynamic fields, this novel method allows detection of effects of microwave fields on specimens, such as observing ferromagnetic materials at resonance.
United Kingdom
- University of Edinburgh United Kingdom
- University of Glasgow United Kingdom
- Osaka Prefecture University Japan
- The Open University United Kingdom
- Versailles Saint-Quentin-en-Yvelines University France
arXiv: Physics::Classical Physics
Library of Congress Subject Headings: lcsh:Medicine lcsh:R lcsh:Science lcsh:Q
Article
Article
arXiv: Physics::Classical Physics
Library of Congress Subject Headings: lcsh:Medicine lcsh:R lcsh:Science lcsh:Q
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Funded by
UKRI| Consortium for advanced materials based on spin chirality
Project
- UK Research and Innovation (UKRI)
- EP/M024423/1
- EPSRC
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- University of Edinburgh United Kingdom
- University of Glasgow United Kingdom
- Osaka Prefecture University Japan
- The Open University United Kingdom
- Versailles Saint-Quentin-en-Yvelines University France
Abstract A technique is presented whereby the performance of a microwave device is evaluated by mapping local field distributions using Lorentz transmission electron microscopy (L-TEM). We demonstrate the method by measuring the polarisation state of the electromagnetic fields produced by a microstrip waveguide as a function of its gigahertz operating frequency. The forward and backward propagating electromagnetic fields produced by the waveguide, in a specimen-free experiment, exert Lorentz forces on the propagating electron beam. Importantly, in addition to the mapping of dynamic fields, this novel method allows detection of effects of microwave fields on specimens, such as observing ferromagnetic materials at resonance.
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