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Publication . Article . 2020

Pseudoexhaustive memory testing based on March A type march tests

Vyacheslav N. Yarmolik; Ireneusz Mrozek; S. V. Yarmolik;
Open Access   Russian  
Published: 26 Jun 2020 Journal: Informatika, volume 17, issue 2, pages 54-70 (issn: 1816-0301, Copyright policy )
Publisher: The United Institute of Informatics Problems of the National Academy of Sciences of Belarus
The relevance of testing of memory devices of modern computing systems is shown. The methods and algorithms for implementing test procedures based on classical March tests are analyzed. Multiple March tests are highlighted to detect complex pattern-sensitive memory faults. To detect them, the necessary condition that test procedures must satisfy to deal complex faults, is substantiated. This condition is in the formation of a pseudo-exhaustive test for a given number of arbitrary memory cells. We study the effectiveness of single and double application of tests like MATS ++, March C– and March A, and also give its analytical estimates for a different number of k ≤ 10 memory cells participating in a malfunction. The applicability of the mathematical model of the combinatorial problem of the coupon collector for describing multiple memory testing is substantiated. The values of the average, minimum, and maximum multiplicity of multiple tests are presented to provide an exhaustive set of binary combinations for a given number of arbitrary memory cells. The validity of analytical estimates is experimentally shown and the high efficiency of the formation of a pseudo-exhaustive coverage by tests of the March A type is confirmed.
Subjects by Vocabulary

Microsoft Academic Graph classification: Memory faults Test procedures Coupon collector's problem Computing systems Memory testing Algorithm Computer science Set (abstract data type) Binary number


testing of computing systems, embedded testing, multi-run testing, march memory tests, pseudo-exhaustive tests, Electronic computers. Computer science, QA75.5-76.95