On multiple fault coverage and aliasing probability measures

descriptionPublicationkeyboard_double_arrow_right Article 06 Jan 2003Publisher:IEEE Comput. Soc. PressJournal:International Test Conference 1988 Proceeding@m_New Frontiers in Testing

Authors: Janusz Rajski; A. Ivanov; V.K. Agarwal; H. Cox;

doi: 10.1109/test.1988.207817

On multiple fault coverage and aliasing probability measures

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Abstract

A comparative study is presented of different methods of calculating multiple fault coverage and aliasing probability measures. The objectives are to describe the ways that these ratios are defined to give them a physical interpretation, and to separate the discussion of how to define the measure from how the measure might be actually obtained or calculated. The interpretation, accuracy, and applicability of the measures are discussed. >

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