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Scanning tunnelling microscopy of carbon nanotubes

Authors: Meunier, Vincent; Lambin, Philippe;

Scanning tunnelling microscopy of carbon nanotubes

Abstract

This paper briefly reviews how scanning tunnelling microscopy (STM) and spectroscopy (STS) are used to analyse the atomic structure and the electronic properties of individual single-wall carbon nanotubes. In this area, the progress accomplished over the past several years has been spectacular. As this paper demonstrates, all the effects predicted by theory have been verified experimentally. Geometrical and electronic effects specific to carbon nanotubes are illustrated by analysing a series of STM images and STS spectra computed using a tight-binding theory. The simulations include a catalogue of images of 27 single-wall nanotubes, Stone-Wales defects in semiconducting nanotubes, and a symmetric Y-junction.

Country
Belgium
Keywords

Crystallography, Nanotubes, Macromolecular Substances, Nanotubes, Carbon, Surface Properties, Molecular Conformation, Biocompatible Materials, Equipment Design, Equipment Failure Analysis, Microscopy, Scanning Tunneling, Materials Testing, Electrochemistry, Nanotechnology, Crystallization

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    popularity
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Powered by OpenAIRE graph
Found an issue? Give us feedback
selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
12
Average
Average
Top 10%
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